Modulated speckle simulations based on the random-walk model

cic.isFulltexttruees
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cic.lugarDesarrolloCentro de Investigaciones Ópticas es
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dc.date.accessioned2015-10-20T14:13:11Z
dc.date.available2015-10-20T14:13:11Z
dc.identifier.urihttps://digital.cic.gba.gob.ar/handle/11746/1228
dc.titleModulated speckle simulations based on the random-walk modelen
dc.typeArtículoes
dcterms.abstractThe random-walk model is employed to simulate modulated speckle patterns. We demonstrate that the geometrical image approximation fails to describe the modulated speckle pattern. A new approach to analyzing this phenomenon is proposed. The validity of the approximations employed is verified by comparison of the simulation with the experimental results. Speckle metrological applications and phase measurement techniques could be improved by taking advantage of this model.en
dcterms.creator.authorLencina, Albertoes
dcterms.creator.authorVaveliuk, Pabloes
dcterms.creator.authorTebaldi, Myrian C.es
dcterms.creator.authorBolognini, Néstores
dcterms.extentp. 1748-1750es
dcterms.isPartOf.issuevol. 28 no. 19es
dcterms.isPartOf.seriesOptics Letterses
dcterms.issued2003-10
dcterms.languageIngléses
dcterms.licenseAttribution 4.0 International (BY 4.0)es
dcterms.relation30 años (1977-2007): Centro de Investigaciones Ópticas (CIOp)es
dcterms.subjectrandom-walk modeles
dcterms.subjectmodulated speckle patternses
dcterms.subject.materiaCiencias Físicases
dcterms.subject.materiaÓptica, Acústicaes
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