Digital speckle pattern interferometry applied to a surface roughness study
| cic.isFulltext | true | es |
| cic.isPeerReviewed | true | es |
| cic.lugarDesarrollo | Centro de Investigaciones Ópticas | es |
| cic.version | info:eu-repo/semantics/submittedVersion | es |
| dc.date.accessioned | 2015-10-05T12:21:15Z | |
| dc.date.available | 2015-10-05T12:21:15Z | |
| dc.identifier.uri | https://digital.cic.gba.gob.ar/handle/11746/1174 | |
| dc.title | Digital speckle pattern interferometry applied to a surface roughness study | en |
| dc.type | Artículo | es |
| dcterms.abstract | Surface roughness determination is of great interest for many applications. Several methods can be found in the literature, but most of them rely on indirect evaluation of the information, such a s photographic techniques. We propose a method to measure surface roughness that takes advantage of digital speckle pattern interferometry for obtaining the data, and of digital image processing for evaluating it. After defining the problem, a theoretical description is presented, and finally it is compared with experimental results, showing good agreement. | en |
| dcterms.creator.author | Lehman, Mario | es |
| dcterms.creator.author | Pomarico, Juan | es |
| dcterms.creator.author | Torroba, Roberto | es |
| dcterms.extent | p. 1148-1152 | es |
| dcterms.isPartOf.issue | vol. 4, no. 4 | es |
| dcterms.isPartOf.series | Optical Engineering | en |
| dcterms.issued | 1995 | |
| dcterms.language | Inglés | es |
| dcterms.license | Attribution 4.0 International (BY 4.0) | es |
| dcterms.relation | 30 años (1977-2007): Centro de Investigaciones Ópticas (CIOp) | es |
| dcterms.subject | digital speckle pattern interferometry | en |
| dcterms.subject | speckle statistics | en |
| dcterms.subject | roughness measurement | en |
| dcterms.subject | interferometry | en |
| dcterms.subject.materia | Ciencias Físicas | es |
| dcterms.subject.materia | Óptica, Acústica | es |
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