Surface roughness measurement through a speckle method

cic.isFulltexttruees
cic.isPeerReviewedtruees
cic.lugarDesarrolloCentro de Investigaciones Ópticas es
cic.versioninfo:eu-repo/semantics/submittedVersiones
dc.date.accessioned2015-09-24T13:13:06Z
dc.date.available2015-09-24T13:13:06Z
dc.identifier.urihttps://digital.cic.gba.gob.ar/handle/11746/1143
dc.titleSurface roughness measurement through a speckle methoden
dc.typeArtículoes
dcterms.abstractAn optical approach for real-time measurement of statistical parameters associated with rough surfaces is proposed. Two crossed polarized, partially correlated, speckle patterns originated from a surface under different illumination conditions arc recorded on a linear photodiode array. The r.m.s. surface roughness is related to the correlation degree between both speckle patterns, which in turn is derived by processing the detected intensity distribution. Some experimental results are shown in order to illustrate this technique.en
dcterms.creator.authorRusso, Nélida Aracelies
dcterms.creator.authorBolognini, Néstores
dcterms.creator.authorSicre, Enrique Eduardoes
dcterms.creator.authorGaravaglia, Mario J.es
dcterms.extentp. 398-395es
dcterms.isPartOf.issuevol. 5 no. 5es
dcterms.isPartOf.seriesInternational Journal of Optoelectronicsen
dcterms.issued1990
dcterms.languageIngléses
dcterms.licenseAttribution 4.0 International (BY 4.0)es
dcterms.relation30 años (1977-2007): Centro de Investigaciones Ópticas (CIOp)es
dcterms.subjectreal-time measurementen
dcterms.subjectspeckle methoden
dcterms.subject.materiaÓptica, Acústicaes
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