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Estudio de una técnica que aplica la espectrometría de rayos X al análisis de aleaciones de estaño-plomo

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cic.lugarDesarrolloLaboratorio de Entrenamiento Multidisciplinario para la Investigación Tecnológica es
cic.parentTypeArticulo
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dc.date.accessioned2015-06-23T18:26:12Z
dc.date.available2015-06-23T18:26:12Z
dc.identifier.urihttps://digital.cic.gba.gob.ar/handle/11746/752
dc.titleEstudio de una técnica que aplica la espectrometría de rayos X al análisis de aleaciones de estaño-plomoes
dc.typeArtículoes
dcterms.abstractA new technique for the analysis of binary alloys by means of X-ray fluorescence is described, as applied to the system tin-lead. Surface determination is avoided making use of intensities ratio of intervening elements. This allows the direct analysis of turnings. The technique is compared with that using po1ishedplates. It has been found that dispersion parameters, on using the method described, are lower than those obtained with the conventional method; this is attributed to segregation.en
dcterms.alternativeStudy of a technique applying X-ray spectrometry to the analysis of tin-lead alloysen
dcterms.creator.authorMiniussi, Claudio L.es
dcterms.creator.authorMeda, Jorge F.es
dcterms.creator.authorPopovsky, Carloses
dcterms.extentp. 83-96es
dcterms.isPartOf.issueSerie II, 1975, nº 4es
dcterms.isPartOf.seriesAnales LEMITes
dcterms.issued1975
dcterms.languageEspañoles
dcterms.licenseAttribution 4.0 International (BY 4.0)es
dcterms.publisherLaboratorio de Entrenamiento Multidisciplinario para la Investigación Tecnológica (LEMIT)es
dcterms.subjectaleaciones binariases
dcterms.subjectRayos Xes
dcterms.subjectplacas pulidases
dcterms.subjectvirutases
dcterms.subject.materiaIngeniería de los Materialeses

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