Documento de conferencia
Hidden grids, moiré patterns and optoelectronically measurement of distances
Hidden grids, moiré patterns and optoelectronically measurement of distances
Resumen
Hidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.
Palabras clave
photocopier hidden grids
CCD hidden grids
moire effect
distance measurement
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