Hidden grids, moiré patterns and optoelectronically measurement of distances

cic.isFulltexttruees
cic.isPeerReviewedtruees
cic.lugarDesarrolloLaboratorio de Investigaciones del Territorio y el Ambiente es
cic.versioninfo:eu-repo/semantics/submittedVersiones
dc.date.accessioned2015-09-24T16:31:21Z
dc.date.available2015-09-24T16:31:21Z
dc.identifier.urihttps://digital.cic.gba.gob.ar/handle/11746/1146
dc.titleHidden grids, moiré patterns and optoelectronically measurement of distancesen
dc.typeDocumento de conferenciaes
dcterms.abstractHidden grids from the photocopy process are used to produce moiré patterns. The method of production of moiré patterns is extended to hidden grids generated in the optoelectronical CCD observations. An application of this moiré is proposed to measure distances.en
dcterms.creator.authorGaravaglia, Mario J.es
dcterms.creator.authorLaquidara, Aníbal Pabloes
dcterms.extentp. 188-192es
dcterms.isPartOf.seriesInternational Symposium on Laser Metrology (Florianópolis, Brasil)es
dcterms.issued1990-10-13
dcterms.languageIngléses
dcterms.licenseAttribution 4.0 International (BY 4.0)es
dcterms.relation30 años (1977-2007): Centro de Investigaciones Ópticas (CIOp)es
dcterms.subjectphotocopier hidden gridsen
dcterms.subjectCCD hidden gridsen
dcterms.subjectmoire effecten
dcterms.subjectdistance measurementen
dcterms.subject.materiaCiencias Físicases
dcterms.subject.materiaÓptica, Acústicaes

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